Suitable for probe testing of LED chips to obtain opto-electronic output characteristics.
Suitable for probe testing of VCSEL, EELD and DFB chips to obtain opto-electronic output characteristics.
Suitable for probe testing of photosensitive devices such as photodiodes (PD), phototransistors (PTR), Schottky diodes and Zener diodes to obtain opto-electronic output characteristics.
Malaysia
