300mm Wafer Inspection Microscope, MTM-MX-12R: Pilihan Utama di Malaysia, Selangor, Kuala Lumpur (KL), Melaka, Penang Acculinks Systems (M) Sdn Bhd

Penerangan

300mm Wafer Inspection Microscope MTM-MX-12R High Precision Semiconductor Wafer Inspection System with Motorized 6-Position Objectives, Brightfield/Darkfield/DIC & Ergonomic Tilting Optics

Engineered for operator comfort and flexibility, the system includes an ergonomic tilting binocular head (0°–35°) and a trinocular port for seamless camera integration. The high eye-point 10X/25mm eyepiece with adjustable diopter ensures comfortable long-duration use in industrial and laboratory environments.

The motorized 6-position objective changer supports a wide range of magnifications (5X to 100X), while advanced inspection techniques including brightfield, darkfield, DIC, and polarization enable comprehensive surface and defect analysis. Combined with precision XY stage control and high-intensity reflected illumination, this system delivers exceptional performance for 300mm wafer inspection applications.

Key Features / Advantages

Designed for 300mm semiconductor wafer inspection
Anti-vibration structure with 6-point support stability system
Low center of gravity design for enhanced imaging precision
Color-corrected infinity optical system for sharp image clarity
Ergonomic 0°–35° tilting binocular head for operator comfort
Trinocular port for camera and digital imaging integration
High eye-point 10X/25mm eyepiece with adjustable diopter
Motorized 6-position objective changer for fast magnification switching
Multiple inspection modes: Brightfield, Darkfield, DIC, Polarization
Precision XY stage with 305mm × 356mm travel range
Coaxial coarse & fine focus with 0.001mm fine resolution
High-intensity 12V 100W reflected illumination system

Technical Specifications

Model	MTM-MX-12R
Application	300mm Wafer Inspection Microscope
Optical System	Color-corrected infinity optical system
Head Type	Binocular (0°–35° tilt) / Trinocular available
Eyepiece	10X / 25mm high eye-point, adjustable diopter
Focus System	Coaxial coarse & fine focus, 35mm coarse travel, 0.001mm fine precision
Objective System	Motorized 6-position changer
Objective Magnification	5X, 10X, 20X, 50X, 100X
Inspection Modes	Brightfield, Darkfield, DIC, Polarization
Filter System	Neutral, Red, Green, Blue filters
Illumination	12V 100W reflected light source
Stage Travel	305 mm × 356 mm, 3-layer working stage with clutch control
Structure	Anti-vibration design with 6 support base system

Enhance your semiconductor inspection accuracy with the MTM-MX-12R 300mm Wafer Inspection Microscope—contact us today for quotation, technical consultation, or customised wafer inspection solutions for advanced manufacturing environments.

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