Hisomet Measuring Microscope, Union: 马来西亚的首选 Acculinks Systems (M) Sdn Bhd

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Hisomet Measuring Microscope Union XYZ High Precision Metrology Microscope with Digital Readout / PC Software, 1µm–0.1µm Resolution, Multi-Stage Travel System for Semiconductor & Industrial Measurement Applications

The system supports a wide range of stage travel configurations from 50×50mm up to 300×300mm, allowing flexibility for different sample sizes and measurement requirements. Users can operate the system via a digital readout counter or connect it directly to a PC with advanced metrology software for enhanced data analysis and reporting.

Equipped with multiple objective lens options from 3X to 100X, the Hisomet Measuring Microscope is widely used in semiconductor manufacturing processes such as wire loop height measurement, die attach height, BGA ball diameter, epoxy height analysis, and lead frame XYZ inspection, delivering reliable and repeatable results.

Key Features / Advantages

High-precision XYZ measuring system for micro-scale dimensional inspection
Ultra-fine resolution options from 1µm to 0.1µm for advanced accuracy
Precise focus indicator and target mark for excellent Z-axis repeatability
Flexible stage travel options from compact to large format (50×50mm to 300×300mm)
Supports digital readout counter or PC-based metrology software integration
Wide range of objective lenses from 3X to 100X for versatile magnification
Designed for semiconductor and microelectronics inspection applications
High stability construction for repeatable industrial-grade measurements
Suitable for automated quality control and precision laboratory environments

Technical Specifications

System Type	XYZ Measuring Microscope (Hisomet – Union)
Focus System	Precise Focus Indicator / Target Mark for High Z-Axis Repeatability
Resolution	1µm / 0.5µm / 0.1µm
Stage Travel Options	50×50mm, 100×50mm, 200×100mm, 250×100mm, 150×150mm, 300×300mm
Output System	Digital Readout Counter or PC with Metrology Software
Objective Lenses	3X, 5X, 10X, 20X, 40X, 100X
Measurement Applications	Wire loop height, die attach height, die placement, BGA ball height, ball diameter, epoxy height, lead frame XYZ measurement
Application Fields	Semiconductor manufacturing, microelectronics, precision engineering, quality control, R&D laboratories

Improve your measurement accuracy and semiconductor inspection capability with the Hisomet Measuring Microscope—contact us today for quotation, technical consultation, or system configuration tailored to your application needs.

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