74LS125D

74LS125D

Category: Elec-component Available (Qty:9999999)
For more information, visit our official website at utsource.us

Description

BUY 74LS125D https://www.utsource.net/itm/p/239786.html
QUADRUPLE BUS BUFFERS WITH 3-STATE OUTPUTS

Parameter Symbol Conditions Min Typ Max Unit
Supply Voltage VCC - 4.75 5.0 5.25 V
Input High Voltage VIH IIH = 20 μA 2.0 - VCC V
Input Low Voltage VIL IIL = -0.4 mA 0 - 0.8 V
Output High Voltage VOH IOH = -0.4 mA 2.4 - VCC - 0.5 V
Output Low Voltage VOL IOL = 16 mA 0 - 0.5 V
Propagation Delay Time tpd VCC = 5V, TA = 25°C - 18 - ns
Power Dissipation PD Per Package - - 100 mW
Operating Temperature TA - -40 - 85 °C
Storage Temperature TSTG - -65 - 150 °C

Instructions for Using 74LS125D:

  1. Supply Voltage:

    • Ensure the supply voltage (VCC) is within the range of 4.75V to 5.25V to avoid damage to the device.
  2. Input Levels:

    • For a high input, the voltage should be at least 2.0V.
    • For a low input, the voltage should not exceed 0.8V.
  3. Output Levels:

    • When driving a load, ensure the output high voltage (VOH) is at least 2.4V when sinking 0.4 mA.
    • The output low voltage (VOL) should not exceed 0.5V when sourcing 16 mA.
  4. Propagation Delay:

    • The propagation delay time (tpd) is typically 18 nanoseconds under standard conditions (VCC = 5V, TA = 25°C).
  5. Power Dissipation:

    • The maximum power dissipation per package is 100 mW. Ensure proper heat dissipation if operating near this limit.
  6. Temperature Range:

    • The operating temperature range is from -40°C to 85°C.
    • The storage temperature range is from -65°C to 150°C.
  7. Handling:

    • Handle the 74LS125D with care to avoid static damage. Use proper ESD protection when handling the device.
  8. Circuit Design:

    • Ensure all inputs are either connected to a valid logic level or pulled up/down as required to prevent floating inputs.
    • Use decoupling capacitors close to the power pins to filter out noise and stabilize the supply voltage.
  9. Testing:

    • Test the device under typical operating conditions to ensure it meets the specified parameters.
    • Verify the functionality by applying known input signals and measuring the corresponding outputs.
(For reference only)

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